Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6807115 | Method of testing a semiconductor integrated device | Kazuo Kanetani, Hiroaki Nambu, Fumihiko Arakawa, Takeshi Kusunoki, Keiichi Higeta | 2004-10-19 |
| 6677782 | Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuit | Kazuo Kanetani, Hiroaki Nambu, Takeshi Kusunoki, Keiichi Higeta, Kunihiko Yamaguchi +1 more | 2004-01-13 |