CM

Christian R. Musil

FE Fei: 2 patents #6 of 27Top 25%
📍 Cambridge, MA: #66 of 439 inventorsTop 20%
🗺 Massachusetts: #740 of 6,583 inventorsTop 15%
Overall (2004): #69,977 of 270,089Top 30%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6770867 Method and apparatus for scanned instrument calibration Henri J. Lezec 2004-08-03
6753538 Electron beam processing J. David Casey, Jr., Thomas J. Gannon, Clive D. Chandler, Xiadong Da 2004-06-22