| #48 |
Michael Sobolewski |
Seepex Gmbh |
1 |
| #48 |
Michael Craig Burrell |
Morpho Detection |
1 |
| #48 |
Michael J. Josef |
Albany International |
1 |
| #48 |
Matthew Patrick Boespflug |
GE |
1 |
| #48 |
Pierre-Andre Bui |
GE |
1 |
| #48 |
David Allen Langan |
GE |
1 |
| #48 |
Jonathan Rullan |
Tokyo Electron Limited |
1 |
| #48 |
John McDonald |
Rensselaer Polytechnic Institute |
1 |
| #48 |
Robert William Delmerico |
GE |
1 |
| #48 |
Alton F. Parker |
Certainteed |
1 |
| #48 |
Donald J. Geisel |
Robotis Co. |
1 |
| #48 |
William A. Luciano |
Albany International |
1 |
| #48 |
Luis Alberto Estrada |
GE |
1 |
| #48 |
Johnny Yit Boey |
GE |
1 |
| #48 |
Steven Jude Ductos |
GE |
1 |
| #48 |
Pratima Rangarajan |
GE |
1 |
| #48 |
Wendy Herrick |
Oak-Mitsui |
1 |
| #48 |
Hua Wang |
GE |
1 |
| #48 |
Kevin J. Shaughnessy |
Molecular Optoelectronics |
1 |
| #48 |
Kathryn A. Shaffer |
Ppg Industries Ohio |
1 |
| #48 |
Ronald J. Gambale |
GE |
1 |
| #48 |
Wayne Nigel Owen Turnbull |
GE |
1 |
| #48 |
Sami Aslam |
GE |
1 |
| #48 |
Joseph Anthony Suriano |
GE |
1 |
| #48 |
Michael James Hartman |
GE |
1 |
| #48 |
James Vradenburg Miller |
GE |
1 |
| #48 |
Somnath Ghosh |
IBM |
1 |
| #48 |
Scott Wheeler |
GE |
1 |
| #48 |
Jeffrey R. Marino |
IBM |
1 |
| #48 |
Anne Herrmann |
GE |
1 |
| #48 |
Ramanath Iyer Ramakrishnan |
GE |
1 |
| #48 |
Weizhong Yan |
GE |
1 |
| #48 |
Mark David D'Ambruoso |
GE |
1 |
| #48 |
Robert A. Sovik |
Transtech Systems |
1 |
| #48 |
Bruno Kristiaan Bernard De Man |
GE |
1 |
| #48 |
Jeffrey Smith |
Tokyo Electron Limited |
1 |