JR

Jonathan Rullan

IBM: 1 patents #1,866 of 5,464Top 35%
📍 Clifton Park, NY: #48 of 136 inventorsTop 40%
🗺 New York: #2,888 of 9,035 inventorsTop 35%
Overall (2004): #187,430 of 270,089Top 70%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6768111 Method for SEM measurement of topological features Oliver C. Wells, Lynne M. Gignac, Conal E. Murray 2004-07-27