TY

Tatsuya Yamada

AD Advantest: 1 patents #26 of 90Top 30%
Overall (2004): #104,078 of 270,089Top 40%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6769083 Test pattern generator, a testing device, and a method of generating a plurality of test patterns Masaru Tsuto 2004-07-27