Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6769083 | Test pattern generator, a testing device, and a method of generating a plurality of test patterns | Tatsuya Yamada | 2004-07-27 |
| 6678852 | Semiconductor device testing apparatus | — | 2004-01-13 |