Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6764380 | Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing | Andreas Norbert Wiswesser, Boguslaw A. Swedek | 2004-07-20 |
WS
Walter Schoenleber
Overall (2004): #90,925 of 270,089Top 35%
1
Patents 2004