Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6664028 | Method of forming opening in wafer layer | I-Hsiung Huang | 2003-12-16 |
| 6656667 | Multiple resist layer photolithographic process | I-Hsiung Huang | 2003-12-02 |
| 6638664 | Optical mask correction method | Chang-Jyh Hsieh, Kuei-Chun Hung, Chien-Ming Wang | 2003-10-28 |
| 6613485 | Optical proximity correction of pattern on photoresist through spacing of sub patterns | Jui-Tsen Huang | 2003-09-02 |
| 6589881 | Method of forming dual damascene structure | I-Hsiung Huang, Kuei-Chun Hung, Ching-Hsu Chang | 2003-07-08 |
| 6580135 | Silicon nitride read only memory structure and method of programming and erasure | Chia-Hsing Chen, Ming-Hung Chou, Cheng-Jye Liu | 2003-06-17 |
| 6579790 | Dual damascene manufacturing process | I-Hsiung Huang | 2003-06-17 |
| 6541782 | Electron beam photolithographic process | I-Hsiung Huang | 2003-04-01 |