Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6593231 | Process of manufacturing electron microscopic sample and process of analyzing semiconductor device | Fujio Masuoka, Takuji Tanigami, Takashi Yokoyama, Noboru Takeuchi | 2003-07-15 |