RW

Rick L. Wise

TI Texas Instruments: 1 patents #317 of 1,093Top 30%
📍 Fairview, TX: #2 of 11 inventorsTop 20%
🗺 Texas: #2,449 of 8,709 inventorsTop 30%
Overall (2003): #133,236 of 273,478Top 50%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6605482 Process for monitoring the thickness of layers in a microelectronic device Francis G. Celii, Maureen A. Hanratty, Katherine E. Violette 2003-08-12