MH

Maureen A. Hanratty

TI Texas Instruments: 1 patents #317 of 1,093Top 30%
📍 Dallas, TX: #149 of 530 inventorsTop 30%
🗺 Texas: #2,449 of 8,709 inventorsTop 30%
Overall (2003): #166,948 of 273,478Top 65%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6605482 Process for monitoring the thickness of layers in a microelectronic device Francis G. Celii, Katherine E. Violette, Rick L. Wise 2003-08-12