Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651206 | Method of design for testability, test sequence generation method and semiconductor integrated circuit | Mitsuyasu Ohta | 2003-11-18 |
| 6510535 | Method of design for testability for integrated circuits | Toshihiro Hiraoka | 2003-01-21 |