Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651206 | Method of design for testability, test sequence generation method and semiconductor integrated circuit | Toshinori Hosokawa | 2003-11-18 |
| 6625784 | Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same | Sadami Takeoka | 2003-09-23 |
| 6615389 | Database for designing integrated circuit device, and method for designing integrated circuit device | Sadami Takeoka, Osamu Ichikawa | 2003-09-02 |