Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6669775 | High resistivity silicon wafer produced by a controlled pull rate czochralski method | Sergei Koveshnikov, Zbigniew J. Radzimski, Neil A. Weaver | 2003-12-30 |
| 6669777 | Method of producing a high resistivity silicon wafer utilizing heat treatment that occurs during device fabrication | Sergei Koveshnikov, Zbigniew J. Radzimski, Neil A. Weaver | 2003-12-30 |
| 6583024 | High resistivity silicon wafer with thick epitaxial layer and method of producing same | Sergei Koveshnikov, Zbigniew J. Radzimski, Neil A. Weaver | 2003-06-24 |
| 6565652 | High resistivity silicon wafer and method of producing same using the magnetic field Czochralski method | Sergei Koveshnikov, Zbigniew J. Radzimski, Neil A. Weaver | 2003-05-20 |
| 6562128 | In-situ post epitaxial treatment process | Gerald R. Dietze | 2003-05-13 |
| 6506667 | Growth of epitaxial semiconductor material with improved crystallographic properties | Mark R. Boydston, Gerald R. Dietze | 2003-01-14 |