Issued Patents 2003
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6643038 | Contact type color image sensor | Yukito Kawahara, Masahiro Yokomichi | 2003-11-04 |
| 6618086 | Linear image sensor | Yukito Kawahara, Tooru Shimizu, Masahiro Yokomichi | 2003-09-09 |
| 6601314 | Method of manufacturing alignment mark | Akiyuki Minami | 2003-08-05 |
| 6589385 | Resist mask for measuring the accuracy of overlaid layers | Akiyuki Minami | 2003-07-08 |
| 6562188 | Resist mask for measuring the accuracy of overlaid layers | Akiyuki Minami | 2003-05-13 |
| 6559063 | Method for manufacturing semiconductor wafer having resist mask with measurement marks for measuring the accuracy of overlay of a photomask | Akiyuki Minami | 2003-05-06 |
| 6545776 | Image sensor IC, facsimile apparatus and image scanner apparatus using the image sensor ICS | Yukito Kawahara, Masahiro Yokomichi | 2003-04-08 |
| 6512604 | Color image reading device | Yukito Kawahara, Masahiro Yokomichi | 2003-01-28 |