YL

Yun-Jae Lee

Samsung: 1 patents #693 of 2,362Top 30%
📍 Seoul, KR: #380 of 1,320 inventorsTop 30%
Overall (2003): #84,196 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6607983 Method of processing a defect source at a wafer edge region in a semiconductor manufacturing Kwang-youl Chun, Won-seong Lee, Jeong-Hoon Oh, Kyu-Hyun Lee 2003-08-19