Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6603691 | SEMICONDUCTOR DEVICE INCLUDING BUILT-IN REDUNDANCY ANALYSIS CIRCUIT FOR SIMULTANEOUSLY TESTING AND ANALYZING FAILURE OF A PLURALITY OF MEMORIES AND METHOD FOR ANALYZING THE FAILURE OF THE PLURALITY OF MEMORIES | Hong-Shin Jun | 2003-08-05 |