Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6658611 | Programmable built-in self-test system for semiconductor memory device | — | 2003-12-02 |
| 6603691 | SEMICONDUCTOR DEVICE INCLUDING BUILT-IN REDUNDANCY ANALYSIS CIRCUIT FOR SIMULTANEOUSLY TESTING AND ANALYZING FAILURE OF A PLURALITY OF MEMORIES AND METHOD FOR ANALYZING THE FAILURE OF THE PLURALITY OF MEMORIES | Young-Doo Yoo | 2003-08-05 |