Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6625511 | Evaluation method and its apparatus of work shop and product quality | Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano | 2003-09-23 |
| 6592812 | Aluminum alloy thin film target material and method for forming thin film using the same | Hiroshi Watanabe | 2003-07-15 |
| 6553273 | Fraction defective estimating method, system for carrying out the same and recording medium | Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano | 2003-04-22 |
| 6526326 | Fraction defective estimating method and system for estimating an assembly fraction defective of an article | Tatsuya Suzuki, Toshijiro Ohashi, Seii Miyakawa, Masaaki Asano | 2003-02-25 |