SM

Seii Miyakawa

HI Hitachi: 3 patents #512 of 4,225Top 15%
Overall (2003): #22,075 of 273,478Top 9%
3
Patents 2003

Issued Patents 2003

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6625511 Evaluation method and its apparatus of work shop and product quality Tatsuya Suzuki, Toshijiro Ohashi, Masaaki Asano, Takashi Kubota 2003-09-23
6553273 Fraction defective estimating method, system for carrying out the same and recording medium Tatsuya Suzuki, Toshijiro Ohashi, Masaaki Asano, Takashi Kubota 2003-04-22
6526326 Fraction defective estimating method and system for estimating an assembly fraction defective of an article Tatsuya Suzuki, Toshijiro Ohashi, Masaaki Asano, Takashi Kubota 2003-02-25