Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646453 | Method for measuring the thickness of multi-layer films | Frank Müller, Norbert Sappelt | 2003-11-11 |
| 6541986 | Sensor for the capacitive measurement of film with thicknesses | Markus Stein | 2003-04-01 |