MS

Markus Stein

📍 Gevelsberg, DE: #1 of 5 inventorsTop 20%
Overall (2003): #52,692 of 273,478Top 20%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6605950 Method and apparatus for measuring film thicknesses 2003-08-12
6541986 Sensor for the capacitive measurement of film with thicknesses Stefan Konermann 2003-04-01