Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6654113 | Surface inspection apparatus | Kazuhiko Fukazawa | 2003-11-25 |
| 6646735 | Surface inspection apparatus and surface inspection method | Kazuhiko Fukazawa, Mari Yamamoto | 2003-11-11 |
| 6563577 | Defect testing apparatus and defect testing method | Koichiro Komatsu | 2003-05-13 |
| 6512579 | Defect inspection apparatus | Kinya Kato | 2003-01-28 |