Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563577 | Defect testing apparatus and defect testing method | Takeo Oomori | 2003-05-13 |
| 6512578 | Method and apparatus for surface inspection | Takeo Omori, Toshiaki Kitamura | 2003-01-28 |