Issued Patents 2003
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661248 | Tester for semiconductor integrated circuits | Hisaya Mori, Shinji Yamada, Hisayoshi Hanai | 2003-12-09 |
| 6653855 | External test auxiliary device to be used for testing semiconductor device | Hisaya Mori, Shinji Yamada | 2003-11-25 |
| 6651023 | Semiconductor test apparatus, and method of testing semiconductor device | Hisaya Mori, Shinji Yamada | 2003-11-18 |
| 6642736 | Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits | Hisaya Mori, Shinji Yamada | 2003-11-04 |
| 6634004 | Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing | Shinji Yamada, Hisaya Mori | 2003-10-14 |
| 6628137 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2003-09-30 |
| 6587975 | Semiconductor test apparatus and method | Hisaya Mori | 2003-07-01 |
| 6546525 | LSI testing apparatus | Masaru Sugimoto, Yasuhide Nakase | 2003-04-08 |
| 6522126 | Semiconductor tester, and method of testing semiconductor using the same | Hisayoshi Hanai, Yasuhiro Mabuchi | 2003-02-18 |