Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6661248 | Tester for semiconductor integrated circuits | Hisaya Mori, Shinji Yamada, Teruhiko Funakura | 2003-12-09 |
| 6522126 | Semiconductor tester, and method of testing semiconductor using the same | Teruhiko Funakura, Yasuhiro Mabuchi | 2003-02-18 |