Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6538264 | Semiconductor reliability test chip | Raymond P. Scholer, Fernando Gonzalez | 2003-03-25 |
| 6535012 | Universal wafer carrier for wafer level die burn-in | Alan G. Wood | 2003-03-18 |