SB

Steve W. Bowes

Micron: 2 patents #294 of 831Top 40%
📍 Boise, ID: #177 of 574 inventorsTop 35%
🗺 Idaho: #257 of 1,039 inventorsTop 25%
Overall (2003): #42,486 of 273,478Top 20%
2
Patents 2003

Issued Patents 2003

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6545829 Method and device for improved lithographic critical dimension control Ulrich Boettiger, Scott L. Light 2003-04-08
6538830 Method and device for improved lithographic critical dimension control Ulrich Boettiger, Scott L. Light 2003-03-25