RB

Raymond J. Beffa

Micron: 4 patents #176 of 831Top 25%
📍 Boise, ID: #75 of 574 inventorsTop 15%
🗺 Idaho: #103 of 1,039 inventorsTop 10%
Overall (2003): #8,315 of 273,478Top 4%
5
Patents 2003

Issued Patents 2003

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
6636068 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud 2003-10-21
6594611 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture 2003-07-15
6534785 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 2003-03-18
6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing 2003-03-04
6504123 Process for sorting integrated circuit devices 2003-01-07