JV

Jorge L. de Varona

Micron: 1 patents #445 of 831Top 55%
📍 Boise, ID: #281 of 574 inventorsTop 50%
🗺 Idaho: #449 of 1,039 inventorsTop 45%
Overall (2003): #194,786 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6620633 Method for testing bumped semiconductor components David R. Hembree 2003-09-16