Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6557129 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Jerzy Tyszer, Mark Kassab | 2003-04-29 |
| 6543020 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Mark Kassab, Jerzy Tyszer | 2003-04-01 |
| 6539409 | Method for synthesizing linear finite state machines | Janusz Rajski, Mark Kassab, Jerzy Tyszer | 2003-03-25 |