Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6662327 | Method for clustered test pattern generation | — | 2003-12-09 |
| 6557129 | Method and apparatus for selectively compacting test responses | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2003-04-29 |
| 6543020 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2003-04-01 |
| 6539409 | Method for synthesizing linear finite state machines | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2003-03-25 |