ZP

Zhijian Pei

MM Memc Electronic Materials: 1 patents #24 of 53Top 50%
📍 Saint Peters, MO: #8 of 20 inventorsTop 40%
🗺 Missouri: #367 of 1,513 inventorsTop 25%
Overall (2003): #82,707 of 273,478Top 35%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6600557 Method for the detection of processing-induced defects in a silicon wafer Anca Stefanescu, Henry F. Erk, Tom Doane 2003-07-29