Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563752 | Qualification test method and circuit for a non-volatile memory | Wen-Jer Tsai, Nian-Kai Zous | 2003-05-13 |
| 6552921 | Circuit to simulate the polarization relaxation phenomenon of the ferroelectric memory | Ching-Wei Tsai, Shyue-Yi Lee | 2003-04-22 |
| 6512696 | Method of programming and erasing a SNNNS type non-volatile memory cell | Tso-Hung Fan, Tao-Cheng Lu, Samuel C. Pan | 2003-01-28 |
| 6512710 | Reliability test method and circuit for non-volatile memory | Wen-Jer Tsai, Lan Huang, Nian-Kai Zous | 2003-01-28 |