Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563752 | Qualification test method and circuit for a non-volatile memory | Wen-Jer Tsai, Ta-Hui Wang | 2003-05-13 |
| 6512710 | Reliability test method and circuit for non-volatile memory | Wen-Jer Tsai, Lan Huang, Ta-Hui Wang | 2003-01-28 |