Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6654132 | Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers | Anh Hoang, Dmitry Bakin | 2003-11-25 |
| 6570662 | Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers | Ahn N. Hoang | 2003-05-27 |