Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6639968 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, David Berman | 2003-10-28 |
| 6556652 | Measurement of critical dimensions using X-rays | Boris Yokhin, Amos Gvirtzman | 2003-04-29 |
| 6512814 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, David Berman | 2003-01-28 |