Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6639968 | X-ray reflectometer | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2003-10-28 |
| 6556652 | Measurement of critical dimensions using X-rays | Isaac Mazor, Amos Gvirtzman | 2003-04-29 |
| 6535575 | Pulsed X-ray reflectometer | — | 2003-03-18 |
| 6512814 | X-ray reflectometer | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2003-01-28 |