Issued Patents 2003
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6539106 | Feature-based defect detection | Harry Gallarda, Chiwoei Wayne Lo, Adam Rhoads | 2003-03-25 |
| 6518571 | Through-the-substrate investigation of flip-chip IC's | James Henry Brown | 2003-02-11 |
| 6509750 | Apparatus for detecting defects in patterned substrates | Chiwoei Wayne Lo | 2003-01-21 |
| 6504393 | Methods and apparatus for testing semiconductor and integrated circuit structures | Chiwoei Wayne Lo, Mariel Stoops | 2003-01-07 |