JD

Jeffrey Danowitz

NI Nova Measuring Instruments: 1 patents #5 of 12Top 45%
Overall (2003): #199,926 of 273,478Top 75%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6544805 Method for determining the internal orientation of a wafer Ido Holcman, Alexander Shulman 2003-04-08