IH

Ido Holcman

NI Nova Measuring Instruments: 1 patents #5 of 12Top 45%
Overall (2003): #207,357 of 273,478Top 80%
1
Patents 2003

Issued Patents 2003

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6544805 Method for determining the internal orientation of a wafer Alexander Shulman, Jeffrey Danowitz 2003-04-08