Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6596980 | Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting | Stefan Rusu, Harry Muljono, Jeremy Rowlette, Dean J. Grannes | 2003-07-22 |
| 6579732 | Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing | Richard H. Livengood, Paul Winer, Michael DiBattista | 2003-06-17 |
| 6519744 | Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane | Steven G. Seidel, Travis Eiles, Stefan Rusu, Dean J. Grannes | 2003-02-11 |