Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6596980 | Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting | Stefan Rusu, Harry Muljono, Gary Woods, Jeremy Rowlette | 2003-07-22 |
| 6519744 | Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane | Steven G. Seidel, Travis Eiles, Gary Woods, Stefan Rusu | 2003-02-11 |