Issued Patents 2003
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6671644 | Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection | Leendert M. Huisman, Franco Motika, Leah Pastel | 2003-12-30 |
| 6662324 | Global transition scan based AC method | Franco Motika, Richard F. Rizzolo, Peilin Song, Ulrich Baur | 2003-12-09 |
| 6629280 | Method and apparatus for delaying ABIST start | Timothy J. Koprowski, Timothy G. McNamara, Pradip Patel | 2003-09-30 |
| 6629281 | Method and system for at speed diagnostics and bit fail mapping | Timothy G. McNamara, Timothy J. Koprowski | 2003-09-30 |
| 6625769 | Method for IC fault analysis using programmable built-in self test and optical emission | Moyra K. Mc Manus, Pia Naoko Sanda | 2003-09-23 |