Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6625769 | Method for IC fault analysis using programmable built-in self test and optical emission | William V. Huott, Pia Naoko Sanda | 2003-09-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6625769 | Method for IC fault analysis using programmable built-in self test and optical emission | William V. Huott, Pia Naoko Sanda | 2003-09-23 |