Issued Patents 2003
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6629058 | Fault diagnosis method and apparatus | Hidemichi Komura, Kazuhiro Shimomura | 2003-09-30 |
| 6617842 | Semiconductor device testing method and system employing trace data | Katsumi Nishikawa | 2003-09-09 |
| 6559429 | Microwave defrosting under reduced pressure | Shunichi Yagi | 2003-05-06 |