Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6617842 | Semiconductor device testing method and system employing trace data | Kazuo Shibata | 2003-09-09 |
| 6569009 | Air passage opening and closing system and air conditioning system having the same | Yoshihiko Okumura | 2003-05-27 |