Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6667483 | Apparatus using charged particle beam | Atsushi Kobaru | 2003-12-23 |
| 6653634 | Method of measuring length with scanning type electron microscope | Kouichi Nagai | 2003-11-25 |
TO
Tadashi Otaka
Hitachi: 2 patents #899 of 4,225Top 25%
Overall (2003): #40,623 of 273,478Top 15%
2
Patents 2003