Issued Patents 2003
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6653634 | Method of measuring length with scanning type electron microscope | Tadashi Otaka | 2003-11-25 |
KN
Kouichi Nagai
Hitachi: 1 patents #1,745 of 4,225Top 45%
Overall (2003): #176,541 of 273,478Top 65%
1
Patents 2003