Issued Patents 2003
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6548811 | Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope | Hiroshi Kakibayashi | 2003-04-15 |
| 6531697 | Method and apparatus for scanning transmission electron microscopy | Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto | 2003-03-11 |